Spectroscopic Characterization
System
In order
to develop high-performance nanoprocess technologies, it is necessary
to characterize the layer structure and the electronic structure
of ultrathin films and their
surfaces on the nanometer (10-9 m) scale. The spectroscopic characterization
system of organic films and surfaces is designed for obtaining
detailed understanding of the fundamental properties and functionality
of organic films, which directly bear on nano-fabrication techniques.
The system consists of (1) an ultrahigh vacuum preparation chamber
for fabricating ultrathin organic films in the 10-10 Torr pressure
range, (2) ultrahigh vacuum scanning tunneling microscope, (3)
spectroscopic ellipsometer, and (4) surface analysis system such
as low energy electron diffraction. Systems from (2) to (4) have
ultrahigh resolution for observation and analysis of the ultrathin
organic films deposited by the UHV preparation chamber (1).
The electronic structure and optical properties of the fabricated
organic films can also be studied using subpicosecond (0.1psec)
laser pulses with tunable wavelength. Using this system, optical
properties such as ultrafast optical response and frequency conversion
can be studied.
Deep understanding of the mechanisms of these properties can be
fed back into nano-
process technology design.
Research Topics
Control of molecular orientation and electronic structure of
organic/inorganic systems
Nonlinear optical phenomena at organic/ inorganic interfaces